Zone Axis Alignment
Objective:
The objective is to superimpose the (i) site of interest, (ii) PL center, and (iii) the center of the Kikuchi pattern together.
In such a way, we have aligned the zone axis with the electron beams at the site of interest simultaneously.
1.PL center >> B2 tilt >> PL re-centering
Mark the screen with two cross lines (center of the screen).
Align the PL (concentric center) to the cross line, then adjust the B2 (comma).
After the B2 correction, you will find the PL is "shifted" from the concentric center.
This is because the actual PL center can only be identified when there is no tilt.
2. Find the site of interest.
Defocus -30um to -100 um using the "Obj Knob" to see the sample with a wide field of view.
Otherwise, you will only see the Kikuchi patterns only.
Select a thin site, so that electrons can pass through the sample for atomic high-resolution imaging.
3. Adjust the Tilt button, such that the PL center overlaps with the zone axis.
Adjust the Tilt button and sample stage iteratively.
The sample stage will shift when you adjust the Tilt button.
Re-adjust the sample stage back to the field of view.
After the PL center matches with the zone axis, you may proceed to step 4.
4. Adjust the Z-height until you can see the channeling pattern.
Double click the STD focus >> Adjust Z height using "Z Up" and "Z Down".
Note: When adjusting the Z-height
(1) the PL center does not shift away from the zone axis
(2) the sample stage does not shift (site of interest remained in the field of view).
(3) the channeling pattern can be found.
Note: When adjusting the Tilt buttons,
(1) the PL center shifts away from the zone axis
(2) the sample stage shift (site of interest drifts)
(3) the channeling pattern also DEVIATES (not in the just-focus condition)
5. Re-align the PL against the "black dot" after zone axis alignment.
Since we use the Orinus detector for the alignment, we should re-align the PL against the "black dot"
Note that, a detector with different camera lengths gives you different PL center.
The sole reference should be the black dot on the fluorescence viewing screen.
If you cannot find your sample in the STEM mode, go to the Low Mag in the TEM mode
Low Mag >> TEM Center >> find you sample >> Oneshot (negative to counter hysteresis)
Focus-ion-beam processed SrTiO3 crystal for the training. We need to find the thinned SrTiO3 with the TEM in the Low Mag mode.
In low Mag mode, the objective lens is switched off, when turning on in the STEM mode, there is a residual magnetic field.